Ashok K. Goel, Terrence H. Tan. Zero-Temperature-Coefficient Biasing Point of a Fully-Depleted SOI MOSFET. In Rex E. Gantenbein, Sung Y. Shin, editors, Proceedings of the ISCA 17th International Conference Computers and Their Applications, April 4-6, 2002, Canterbury Hotel, San Francisco, California, USA. pages 454-457, ISCA, 2002.
@inproceedings{GoelT02,
title = {Zero-Temperature-Coefficient Biasing Point of a Fully-Depleted SOI MOSFET},
author = {Ashok K. Goel and Terrence H. Tan},
year = {2002},
researchr = {https://researchr.org/publication/GoelT02},
cites = {0},
citedby = {0},
pages = {454-457},
booktitle = {Proceedings of the ISCA 17th International Conference Computers and Their Applications, April 4-6, 2002, Canterbury Hotel, San Francisco, California, USA},
editor = {Rex E. Gantenbein and Sung Y. Shin},
publisher = {ISCA},
isbn = {1-880843-42-0},
}