High-resolution electroencephalographic forward modeling in traumatic brain injury using the finite element method

S. Y. Matt Goh, Andrei Irimia, Carinna M. Torgerson, Ron Kikinis, Paul M. Vespa, John D. Van Horn. High-resolution electroencephalographic forward modeling in traumatic brain injury using the finite element method. In ISBI. pages 990-993, 2013. [doi]

Abstract

Abstract is missing.