Akin Gokalan, Suleyman Tosun, Deniz Dal. Library Characterization of Arithmetic Circuits for Reliability-Aware Designs in SRAM-Based FPGAs. J. Electronic Testing, 36(6):743-756, 2020. [doi]
@article{GokalanTD20,
title = {Library Characterization of Arithmetic Circuits for Reliability-Aware Designs in SRAM-Based FPGAs},
author = {Akin Gokalan and Suleyman Tosun and Deniz Dal},
year = {2020},
doi = {10.1007/s10836-020-05913-1},
url = {https://doi.org/10.1007/s10836-020-05913-1},
researchr = {https://researchr.org/publication/GokalanTD20},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {36},
number = {6},
pages = {743-756},
}