Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors

G. Golan, E. Rabinovich, A. Inberg, A. Axelevitch, G. Lubarsky, P. G. Rancoita, M. Demarchi, A. Seidman, N. Croitoru. Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors. Microelectronics Reliability, 41(1):67-72, 2001. [doi]

Abstract

Abstract is missing.