Near-field of a scanning aperture microwave probe: a 3-D finite element analysis

Michael Golosovsky, E. Maniv, Dan Davidov, A. Frenkel. Near-field of a scanning aperture microwave probe: a 3-D finite element analysis. IEEE T. Instrumentation and Measurement, 51(5):1090-1096, 2002. [doi]

Abstract

Abstract is missing.