A New Degradation Indicator Based on a Statistical Anomaly Approach

Joao Paulo Pordeus Gomes, Roberto Kawakami Harrop Galvão, Takashi Yoneyama, Bruno P. Leao. A New Degradation Indicator Based on a Statistical Anomaly Approach. IEEE Transactions on Reliability, 65(1):326-335, 2016. [doi]

Abstract

Abstract is missing.