Methodology for achieving best trade-off of area and fault masking coverage in ATMR

Iuri A. C. Gomes, Mayler Martins, Fernanda Lima Kastensmidt, AndrĂ© InĂ¡cio Reis, Renato P. Ribas, Sylvain P. Novales. Methodology for achieving best trade-off of area and fault masking coverage in ATMR. In 15th Latin American Test Workshop - LATW 2014, Fortaleza, Brazil, March 12-15, 2014. pages 1-6, IEEE, 2014. [doi]

Abstract

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