Alfred V. Gomes, Ramakrishna Voorakaranam, Abhijit Chatterjee. Modular Fault Simulation of Mixed Signal Circuits with Fault Ranking by Severity. In 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 98), 2-4 November 1998, Austin, TX, USA, Proceedings. pages 341-348, IEEE Computer Society, 1998. [doi]
@inproceedings{GomesVC98,
title = {Modular Fault Simulation of Mixed Signal Circuits with Fault Ranking by Severity},
author = {Alfred V. Gomes and Ramakrishna Voorakaranam and Abhijit Chatterjee},
year = {1998},
url = {http://computer.org/proceedings/dft/8832/88320341abs.htm},
researchr = {https://researchr.org/publication/GomesVC98},
cites = {0},
citedby = {0},
pages = {341-348},
booktitle = {13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 98), 2-4 November 1998, Austin, TX, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-8186-8832-7},
}