Modular Fault Simulation of Mixed Signal Circuits with Fault Ranking by Severity

Alfred V. Gomes, Ramakrishna Voorakaranam, Abhijit Chatterjee. Modular Fault Simulation of Mixed Signal Circuits with Fault Ranking by Severity. In 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 98), 2-4 November 1998, Austin, TX, USA, Proceedings. pages 341-348, IEEE Computer Society, 1998. [doi]

Abstract

Abstract is missing.