Alvaro Gómez-Pau, Luz Balado, Joan Figueras. Analog circuits testing using digitally coded indirect measurements. In 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2015, Napoli, Italy, April 21-23, 2015. pages 1-6, IEEE, 2015. [doi]
@inproceedings{Gomez-PauBF15, title = {Analog circuits testing using digitally coded indirect measurements}, author = {Alvaro Gómez-Pau and Luz Balado and Joan Figueras}, year = {2015}, doi = {10.1109/DTIS.2015.7127357}, url = {http://dx.doi.org/10.1109/DTIS.2015.7127357}, researchr = {https://researchr.org/publication/Gomez-PauBF15}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2015, Napoli, Italy, April 21-23, 2015}, publisher = {IEEE}, isbn = {978-1-4799-1999-4}, }