Abstract is missing.
- Analog circuits testing using digitally coded indirect measurementsAlvaro Gómez-Pau, Luz Balado, Joan Figueras. 1-6 [doi]
- Application-independent testing of multilevel interconnect in mesh-based FPGAsSaif-Ur Rehman, Mounir Benabdenbi, Lorena Anghel. 1-6 [doi]
- Physical attacks, introduction and application to embedded processorsFrancesco Regazzoni. 1 [doi]
- Modeling and simulation of Cyber-Physical Systems with SICYPHOSFrank Wawrzik, William Chipman, Javier Moreno Molina, Christoph Grimm 0001. 1-6 [doi]
- Application-specific power-aware mapping for reconfigurable NoC architecturesMehran Goli, Amin Ghasemazar, Zainalabedin Navabi. 1-6 [doi]
- A modular suite to support human-smartphone interaction for people with motor skill impairmentsMassimiliano Donati, Luca Fanucci, Fabrizio Iacopetti, Alessio Vecchio. 1-5 [doi]
- All digital phase interpolatorAndreas Tsimpos, George Souliotis, Andreas Demartinos, Spiros Vlassis. 1-6 [doi]
- A digital pseudorandom uniform noise generator for ADC built-in self-testJose Domingos Alves, Guiomar Evans. 1-6 [doi]
- Supply voltage variation impact on Anderson PUF qualityMario Barbareschi, Pierpaolo Bagnasco, Antonino Mazzeo. 1-6 [doi]
- Why caring about leading-edge software engineering in healthcare and assistive technology applications?Tiziana Margaria. 1 [doi]
- Utilizing NOPs for online deterministic testing of simple processing coresRasoul Jafari, Elham Zahraei Salehi, Zain Navabi. 1-2 [doi]
- DTIS 2015 forewordPaolo Prinetto, Giorgio Di Natale. 1 [doi]
- Frictionless wearable technology: The key to unleashing the power of wearable sensors for health and lyfestyleChris Van Hoof. 1 [doi]
- A concurrent BIST scheme for read only memoriesIoannis Voyiatzis, Cleo Sgouropoulou, Costas Efstathiou. 1-2 [doi]
- An effective ATPG flow for Gate Delay FaultsAlberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda. 1-6 [doi]
- A generic moduli selection algorithm for the Residue Number SystemMinas Dasygenis, Ioannis Petrousov. 1-2 [doi]
- Multi-valued logic test access mechanism for test time and power reductionAmirreza Nekooei, Zainalabedin Navabi. 1-6 [doi]
- Analog layout constraints resolution and shape function generation using Satisfiability Modulo TheoriesSherif M. Saif, Mohamed Dessouky, Hazem M. Abbas, M. Watheq El-Kharashi, Salwa M. Nassar. 1-6 [doi]
- Implementation and verification of a generic universal memory controller based on UVMKhaled Khalifa, Khaled Salah. 1-2 [doi]
- Software testing and software fault injectionMaha Kooli, Alberto Bosio, Pascal Benoit, Lionel Torres. 1-6 [doi]
- A heuristic algorithm for high level synthesis of decimal arithmetic circuits using SystemCMehdi Sedighi, Foroogh Haddadi, Samaneh Emami, Mahya Saffarpour. 1-6 [doi]
- Electronics and computing in nano-era: The good, the bad and the challengingSaid Hamdioui. 1 [doi]
- Scan-chain intra-cell defects gradingA. Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda. 1-6 [doi]
- On the limitations of logic testing for detecting Hardware Trojans HorsesMarie-Lise Flottes, Sophie Dupuis, Papa-Sidi Ba, Bruno Rouzeyre. 1-5 [doi]
- Test set embedding into hardware generated sequences using an embedding algorithmIoannis Voyiatzis, Dimitris J. Kavvadias, S. Sinitos, K. Vlahantonis, P. Kyrkos, Cleo Sgouropoulou, Costas Efstathiou. 1-2 [doi]
- HDLs evolve as they affect design methodology for a higher abstraction and a better integrationZainalabedin Navabi. 1 [doi]
- STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variationsElena I. Vatajelu, Rosa Rodríguez-Montañés, Marco Indaco, Paolo Prinetto, Joan Figueras. 1-6 [doi]
- Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense AmplifierInnocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Stefan Cosemans, Pieter Weckx, Praveen Raghavan, Francky Catthoor. 1-6 [doi]
- Comparative study of two CMOS operational amplifiers for high performance pipelined ADCAbdelghani Dendouga, Slimane Oussalah. 1-2 [doi]
- Silicon CMOS compatible in situ CCVD growth of graphene on silicon nitrideD. Noll, Udo Schwalke. 1-3 [doi]
- A TSV to TSV, A TSV to Metal interconnects, and A TSV to active device coupling capacitance: Analysis and recommendationsKhaled Salah. 1-2 [doi]
- 3D integration in biochips: New proposed architectures for 3D applications in ATDA based digital microfluidic biochipsPranab Roy, Pampa Howladar, Raja Dastidar, Hafizur Rahaman, Parthasarathi Dasgupta. 1-6 [doi]
- A 3GHz VCO suitable for MIPI M-PHY serial interfaceA. C. Demartinos, A. Tsimpos, S. Vlassis, S. Sgourenas, G. Souliotis. 1-6 [doi]
- A networking EDA tool for multi-vector multiplication IP circuitsMinas Dasygenis, Ioannis Petrousov. 1-2 [doi]
- A cloud robotics system for telepresence enabling mobility impaired people to enjoy the whole museum experienceMiguel Efrain Kaouk Ng, Stefano Primatesta, Luca Giuliano, Maria Luce Lupetti, Ludovico Orlando Russo, Giuseppe Airo Farulla, Marco Indaco, Stefano Rosa, Claudio Germak, Basilio Bona. 1-6 [doi]
- Automated characterization of TAS-MRAM test arraysAlessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Jérémy Alvarez-Herault, Ken Mackay. 1-2 [doi]
- Application of functional IDDQ testing in a VLIW processor towards detection of aging degradationYong Zhao, Hans G. Kerkhoff. 1-5 [doi]
- ORIENTOMA: A novel platform for autonomous and safe navigation for blind and visually impairedGiuseppe Airo Farulla, Ludovico Orlando Russo, Stefano Rosa, Marco Indaco. 1-6 [doi]
- Online self adjusting progressive age monitoring of timing variationsSomayeh Sadeghi Kohan, Mehdi Kamal, John McNeil, Paolo Prinetto, Zain Navabi. 1-2 [doi]
- Detecting untestable hardware Trojan with non-intrusive concurrent on line testingIoannis Voyiatzis, Cleo Sgouropoulou, C. Estathiou. 1-2 [doi]
- Testing 90 nm microcontroller SRAM PUF qualityMario Barbareschi, Ermanno Battista, Antonino Mazzeo, Nicola Mazzocca. 1-6 [doi]
- Towards formal validation: Symbolic simulation of SystemC modelsCarna Radojicic, Thiyagarajan Purusothaman, Christoph Grimm. 1-6 [doi]
- Wearable speech enhancement system based on MEMS microphone array for disabled peopleAlessandro Palla, Luca Fanucci, Roberto Sannino, Mattia Settin. 1-5 [doi]
- Statistical lifetime analysis of memristive crossbar matrixPeyman Pouyan, Esteve Amat, Antonio Rubio. 1-6 [doi]
- Fault attacks, injection techniques and tools for simulationRoberta Piscitelli, Shivam Bhasin, Francesco Regazzoni. 1-6 [doi]
- 2T2M memristor based TCAM cell for low power applicationsYuanfan Yang, Jimson Mathew, Marco Ottavi, Salvatore Pontarelli, Dhiraj K. Pradhan. 1-6 [doi]
- A simple numerical modeling technique for PSP-NQS differential equationAhmed Abo-Elhadeed, Pascal Bolcato. 1-4 [doi]
- A design-flow for high-level synthesis and resource estimation of reconfigurable architecturesMuhammad Adeel Pasha, Bilal Siddiqui, Umer Farooq. 1-6 [doi]
- Bayesian recognition of human identities from continuous visual features for safe and secure access in healthcare environmentsFrederik Gossen. 1-5 [doi]
- Aging in digital circuits and age monitoring: Object-oriented modeling and evaluationSomayeh Sadeghi Kohan, Arezoo Kamran, Farnaz Forooghifar, Zainalabedin Navabi. 1-6 [doi]
- Variable Gain Amplifier in CMOS 0.18µm for WiMAX applicationSawssen Lahiani, Dorra Ayadi, Samir Ben Salem, Skandar Douss, Mourad Loulou. 1-2 [doi]
- Modeling avalanche breakdown for ESD diodes in integrated circuitsCamillo Stefanucci, Pietro Buccella, Maher Kayal, Jean-Michel Sallese. 1-3 [doi]
- Gait analysis for fall prediction using EMG triggered movement related potentialsValerio F. Annese, Daniela De Venuto. 1-6 [doi]