Effective selection of favorable gates in BTI-critical paths to enhance circuit reliability

Andres Gomez, Víctor H. Champac. Effective selection of favorable gates in BTI-critical paths to enhance circuit reliability. In 16th Latin-American Test Symposium, LATS 2015, Puerto Vallarta, Mexico, March 25-27, 2015. pages 1-6, IEEE, 2015. [doi]

Authors

Andres Gomez

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Víctor H. Champac

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