Selection of Critical Paths for Reliable Frequency Scaling under BTI-Aging Considering Workload Uncertainty and Process Variations Effects

Andres F. Gomez, Víctor H. Champac. Selection of Critical Paths for Reliable Frequency Scaling under BTI-Aging Considering Workload Uncertainty and Process Variations Effects. ACM Trans. Design Autom. Electr. Syst., 23(3), 2018. [doi]

@article{GomezC18,
  title = {Selection of Critical Paths for Reliable Frequency Scaling under BTI-Aging Considering Workload Uncertainty and Process Variations Effects},
  author = {Andres F. Gomez and Víctor H. Champac},
  year = {2018},
  doi = {10.1145/3177864},
  url = {http://doi.acm.org/10.1145/3177864},
  researchr = {https://researchr.org/publication/GomezC18},
  cites = {0},
  citedby = {0},
  journal = {ACM Trans. Design Autom. Electr. Syst.},
  volume = {23},
  number = {3},
}