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Selection of Critical Paths for Reliable Frequency Scaling under BTI-Aging Considering Workload Uncertainty and Process Variations Effects

Andres F. Gomez, Víctor H. Champac. Selection of Critical Paths for Reliable Frequency Scaling under BTI-Aging Considering Workload Uncertainty and Process Variations Effects. ACM Trans. Design Autom. Electr. Syst., 23(3), 2018. [doi]

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