Roberto Gómez, Alejandro Girón, Víctor H. Champac. Test of Interconnection Opens Considering Coupling Signals. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 247-258, IEEE Computer Society, 2005. [doi]
Abstract is missing.