Roberto Gómez, Alejandro Girón, Víctor H. Champac. A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines. J. Electronic Testing, 24(6):529-538, 2008. [doi]
@article{GomezGC08,
title = {A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines},
author = {Roberto Gómez and Alejandro Girón and Víctor H. Champac},
year = {2008},
doi = {10.1007/s10836-008-5085-z},
url = {http://dx.doi.org/10.1007/s10836-008-5085-z},
tags = {testing, source-to-source, open-source},
researchr = {https://researchr.org/publication/GomezGC08},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {24},
number = {6},
pages = {529-538},
}