Andres F. Gomez, Felipe Lavratti, Guilherme Medeiros, M. Sartori, Letícia Maria Veiras Bolzani, Víctor H. Champac, Fabian Vargas. Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations. Microelectronics Reliability, 67:150-158, 2016. [doi]
Abstract is missing.