VAASI: Crafting valid and abnormal adversarial samples for anomaly detection systems in industrial scenarios

Ángel Luis Perales Gómez, Lorenzo Fernández Maimó, Alberto Huertas Celdrán, Félix J. García Clemente. VAASI: Crafting valid and abnormal adversarial samples for anomaly detection systems in industrial scenarios. Inf. Sec. Techn. Report, 79:103647, December 2023. [doi]

Abstract

Abstract is missing.