Realistic Fault Extraction for High-Quality Design and Test of VLSI Systems - researchr publication authors

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Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira. Realistic Fault Extraction for High-Quality Design and Test of VLSI Systems. In 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT 97), 20-22 October 1997, Paris, France. pages 29-37, IEEE Computer Society, 1997. [doi]

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