Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira. Realistic Fault Extraction for High-Quality Design and Test of VLSI Systems. In 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT 97), 20-22 October 1997, Paris, France. pages 29-37, IEEE Computer Society, 1997. [doi]
@inproceedings{GoncalvesTT97,
title = {Realistic Fault Extraction for High-Quality Design and Test of VLSI Systems},
author = {Fernando M. Gonçalves and Isabel C. Teixeira and João Paulo Teixeira},
year = {1997},
url = {http://computer.org/proceedings/dft/8168/81680029abs.htm},
tags = {testing, C++, design},
researchr = {https://researchr.org/publication/GoncalvesTT97},
cites = {0},
citedby = {0},
pages = {29-37},
booktitle = {1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT 97), 20-22 October 1997, Paris, France},
publisher = {IEEE Computer Society},
isbn = {0-8186-8168-3},
}