Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici. Variable-length input Huffman coding for system-on-a-chip test. IEEE Trans. on CAD of Integrated Circuits and Systems, 22(6):783-796, 2003. [doi]
@article{GonciariAN03,
title = {Variable-length input Huffman coding for system-on-a-chip test},
author = {Paul Theo Gonciari and Bashir M. Al-Hashimi and Nicola Nicolici},
year = {2003},
doi = {10.1109/TCAD.2003.811451},
url = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2003.811451},
tags = {testing},
researchr = {https://researchr.org/publication/GonciariAN03},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {22},
number = {6},
pages = {783-796},
}