Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici. Synchronization overhead in SOC compressed test. IEEE Trans. VLSI Syst., 13(1):140-152, 2005. [doi]
@article{GonciariAN05,
title = {Synchronization overhead in SOC compressed test},
author = {Paul Theo Gonciari and Bashir M. Al-Hashimi and Nicola Nicolici},
year = {2005},
doi = {10.1109/TVLSI.2004.834238},
url = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2004.834238},
tags = {synchronization, testing},
researchr = {https://researchr.org/publication/GonciariAN05},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {13},
number = {1},
pages = {140-152},
}