Determining fluctuation in bio-nanomachines from electron microscopy images

Yunye Gong, Peter C. Doerschuk. Determining fluctuation in bio-nanomachines from electron microscopy images. In 2015 IEEE International Conference on Image Processing, ICIP 2015, Quebec City, QC, Canada, September 27-30, 2015. pages 262-265, IEEE, 2015. [doi]

Authors

Yunye Gong

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Peter C. Doerschuk

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