Yunye Gong, Peter C. Doerschuk. Determining fluctuation in bio-nanomachines from electron microscopy images. In 2015 IEEE International Conference on Image Processing, ICIP 2015, Quebec City, QC, Canada, September 27-30, 2015. pages 262-265, IEEE, 2015. [doi]
@inproceedings{GongD15,
title = {Determining fluctuation in bio-nanomachines from electron microscopy images},
author = {Yunye Gong and Peter C. Doerschuk},
year = {2015},
doi = {10.1109/ICIP.2015.7350800},
url = {http://dx.doi.org/10.1109/ICIP.2015.7350800},
researchr = {https://researchr.org/publication/GongD15},
cites = {0},
citedby = {0},
pages = {262-265},
booktitle = {2015 IEEE International Conference on Image Processing, ICIP 2015, Quebec City, QC, Canada, September 27-30, 2015},
publisher = {IEEE},
isbn = {978-1-4799-8339-1},
}