Seong-Lyong Gong, Jungrae Kim, Mattan Erez. DRAM Scaling Error Evaluation Model Using Various Retention Time. In 47th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, DSN Workshops 2017, Denver, CO, USA, June 26-29, 2017. pages 177-183, IEEE Computer Society, 2017. [doi]
@inproceedings{GongKE17,
title = {DRAM Scaling Error Evaluation Model Using Various Retention Time},
author = {Seong-Lyong Gong and Jungrae Kim and Mattan Erez},
year = {2017},
doi = {10.1109/DSN-W.2017.48},
url = {http://doi.ieeecomputersociety.org/10.1109/DSN-W.2017.48},
researchr = {https://researchr.org/publication/GongKE17},
cites = {0},
citedby = {0},
pages = {177-183},
booktitle = {47th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, DSN Workshops 2017, Denver, CO, USA, June 26-29, 2017},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-2272-8},
}