Seong-Lyong Gong, Jungrae Kim, Mattan Erez. DRAM Scaling Error Evaluation Model Using Various Retention Time. In 47th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, DSN Workshops 2017, Denver, CO, USA, June 26-29, 2017. pages 177-183, IEEE Computer Society, 2017. [doi]
Abstract is missing.