Yunzhan Gong, Wanli Xu, Xiaowei Li. An Expression s Single Fault Model and the Testing Methods. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 110-115, IEEE Computer Society, 2003. [doi]
@inproceedings{GongXL03,
title = {An Expression s Single Fault Model and the Testing Methods},
author = {Yunzhan Gong and Wanli Xu and Xiaowei Li},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/ats/2003/1951/00/19510110abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/GongXL03},
cites = {0},
citedby = {0},
pages = {110-115},
booktitle = {12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China},
publisher = {IEEE Computer Society},
isbn = {0-7695-1951-2},
}