Dun-Wei Gong, Yan Zhang. Generating Test Data for Both Paths Coverage and Faults Detection Using Genetic Algorithms. In De-Shuang Huang, Yong Gan, Phalguni Gupta, M. Michael Gromiha, editors, Advanced Intelligent Computing Theories and Applications. With Aspects of Artificial Intelligence - 7th International Conference, ICIC 2011, Zhengzhou, China, August 11-14, 2011, Revised Selected Papers. Volume 6839 of Lecture Notes in Computer Science, pages 664-671, Springer, 2011. [doi]
@inproceedings{GongZ11-3,
title = {Generating Test Data for Both Paths Coverage and Faults Detection Using Genetic Algorithms},
author = {Dun-Wei Gong and Yan Zhang},
year = {2011},
doi = {10.1007/978-3-642-25944-9_87},
url = {http://dx.doi.org/10.1007/978-3-642-25944-9_87},
researchr = {https://researchr.org/publication/GongZ11-3},
cites = {0},
citedby = {0},
pages = {664-671},
booktitle = {Advanced Intelligent Computing Theories and Applications. With Aspects of Artificial Intelligence - 7th International Conference, ICIC 2011, Zhengzhou, China, August 11-14, 2011, Revised Selected Papers},
editor = {De-Shuang Huang and Yong Gan and Phalguni Gupta and M. Michael Gromiha},
volume = {6839},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-642-25943-2},
}