Generating Test Data for Both Paths Coverage and Faults Detection Using Genetic Algorithms

Dun-Wei Gong, Yan Zhang. Generating Test Data for Both Paths Coverage and Faults Detection Using Genetic Algorithms. In De-Shuang Huang, Yong Gan, Phalguni Gupta, M. Michael Gromiha, editors, Advanced Intelligent Computing Theories and Applications. With Aspects of Artificial Intelligence - 7th International Conference, ICIC 2011, Zhengzhou, China, August 11-14, 2011, Revised Selected Papers. Volume 6839 of Lecture Notes in Computer Science, pages 664-671, Springer, 2011. [doi]

Abstract

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