Alberto González-Sanchez, Éric Piel, Hans-Gerhard Gross, Arjan J. C. van Gemund. A Diagnostic Point of View for the Optimization of Preparation Costs in Runtime Testing. In Fourth International IEEE Conference on Software Testing, Verification and Validation, ICST 2012, Berlin, Germany, 21-25 March, 2011, Workshop Proceedings. pages 654-660, IEEE Computer Society, 2011. [doi]
@inproceedings{Gonzalez-SanchezPGG11,
title = {A Diagnostic Point of View for the Optimization of Preparation Costs in Runtime Testing},
author = {Alberto González-Sanchez and Éric Piel and Hans-Gerhard Gross and Arjan J. C. van Gemund},
year = {2011},
doi = {10.1109/ICSTW.2011.21},
url = {http://doi.ieeecomputersociety.org/10.1109/ICSTW.2011.21},
researchr = {https://researchr.org/publication/Gonzalez-SanchezPGG11},
cites = {0},
citedby = {0},
pages = {654-660},
booktitle = {Fourth International IEEE Conference on Software Testing, Verification and Validation, ICST 2012, Berlin, Germany, 21-25 March, 2011, Workshop Proceedings},
publisher = {IEEE Computer Society},
}