Alberto González-Sanchez, Éric Piel, Hans-Gerhard Gross, Arjan J. C. van Gemund. A Diagnostic Point of View for the Optimization of Preparation Costs in Runtime Testing. In Fourth International IEEE Conference on Software Testing, Verification and Validation, ICST 2012, Berlin, Germany, 21-25 March, 2011, Workshop Proceedings. pages 654-660, IEEE Computer Society, 2011.
Abstract is missing.