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An in-depth study on WENO-based techniques to improve parameter extraction procedures in MOSFET transistors

Pedro González, María J. Ibáñez, Andrés M. Roldán, Juan B. Roldán. An in-depth study on WENO-based techniques to improve parameter extraction procedures in MOSFET transistors. Mathematics and Computers in Simulation, 118:248-257, 2015. [doi]

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