Performance and Reliability Review of 650 V and 900 V Silicon and SiC Devices: MOSFETs, Cascode JFETs and IGBTs - researchr publication authors

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Jose Angel Ortiz Gonzalez, Ruizhu Wu, Saeed Jahdi, Olayiwola Alatise. Performance and Reliability Review of 650 V and 900 V Silicon and SiC Devices: MOSFETs, Cascode JFETs and IGBTs. IEEE Transactions on Industrial Electronics, 67(9):7375-7385, 2020. [doi]

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