Jose Angel Ortiz Gonzalez, Ruizhu Wu, Saeed Jahdi, Olayiwola Alatise. Performance and Reliability Review of 650 V and 900 V Silicon and SiC Devices: MOSFETs, Cascode JFETs and IGBTs. IEEE Transactions on Industrial Electronics, 67(9):7375-7385, 2020. [doi]
@article{GonzalezWJA20,
title = {Performance and Reliability Review of 650 V and 900 V Silicon and SiC Devices: MOSFETs, Cascode JFETs and IGBTs},
author = {Jose Angel Ortiz Gonzalez and Ruizhu Wu and Saeed Jahdi and Olayiwola Alatise},
year = {2020},
doi = {10.1109/TIE.2019.2945299},
url = {https://doi.org/10.1109/TIE.2019.2945299},
researchr = {https://researchr.org/publication/GonzalezWJA20},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Industrial Electronics},
volume = {67},
number = {9},
pages = {7375-7385},
}