Affine/ Photometric Invariants for Planar Intensity Patterns

Luc J. Van Gool, Theo Moons, Dorin Ungureanu. Affine/ Photometric Invariants for Planar Intensity Patterns. In Bernard F. Buxton, Roberto Cipolla, editors, Computer Vision - ECCV 96, 4th European Conference on Computer Vision, Cambridge, UK, April 15-18, 1996, Proceedings, Volume I. Volume 1064 of Lecture Notes in Computer Science, pages 642-651, Springer, 1996.

Abstract

Abstract is missing.