A. J. van de Goor, Said Hamdioui, Zaid Al-Ars. The Effectiveness of the Scan Test and Its New Variants. In 12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA. pages 26-31, IEEE Computer Society, 2004. [doi]
@inproceedings{GoorHA04,
title = {The Effectiveness of the Scan Test and Its New Variants},
author = {A. J. van de Goor and Said Hamdioui and Zaid Al-Ars},
year = {2004},
doi = {10.1109/MTDT.2004.22},
url = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2004.22},
tags = {testing},
researchr = {https://researchr.org/publication/GoorHA04},
cites = {0},
citedby = {0},
pages = {26-31},
booktitle = {12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2193-2},
}