Abstract is missing.
- Fast Error-Correcting Circuits for Fault-Tolerant MemoryElaine Ou, Woodward Yang. 8-12 [doi]
- Tag Skipping Technique Using WTS Buffer for Optimal Low Power Cache DesignAdil Akaaboune, Nazeih Botros, Jaafar Alghazo. 13-18 [doi]
- SF-LRU Cache Replacement AlgorithmJaafar Alghazo, Adil Akaaboune, Nazeih Botros. 19-24 [doi]
- The Effectiveness of the Scan Test and Its New VariantsA. J. van de Goor, Said Hamdioui, Zaid Al-Ars. 26-31 [doi]
- Influence of Bit Line Twisting on the Faulty Behavior of DRAMsZaid Al-Ars, Martin Herzog, Ivo Schanstra, A. J. van de Goor. 32-37 [doi]
- Markov Models of Fault-Tolerant Memory Systems under SEULuca Schiano, Marco Ottavi, Fabrizio Lombardi. 38-43 [doi]
- Tutorial on Magnetic Tunnel Junction Magnetoresistive Random-Access MemoryBruce F. Cockburn. 46-51 [doi]
- The State-of-Art and Future Trends in Testing Embedded MemoriesSaid Hamdioui, Georgi Gaydadjiev, A. J. van de Goor. 54-59 [doi]
- Built-in Self-Test and Repair (BISTR) Techniques for Embedded RAMsShyue-Kung Lu, Shih-Chang Huang. 60-64 [doi]
- A Parallel Built-in Diagnostic Scheme for Multiple Embedded MemoriesLi-Ming Denq, Rei-Fu Huang, Cheng-Wen Wu, Yeong-Jar Chang, Wen Ching Wu. 65-69 [doi]
- Micro Programmable Built-In Self Repair for SRAMsRita Zappa, Carolina Selva, Danilo Rimondi, Cosimo Torelli, M. Crestan, Giovanni Mastrodomenico, Lara Albani. 72-77 [doi]
- A Novel Method for Silicon Configurable Test Flow and Algorithms for Testing, Debugging and Characterizing Different Types of Embedded Memories through a Shared ControllerSwapnil Bahl. 78-83 [doi]
- A Programmable Built-in Self-Diagnosis for Embedded SRAMCarolina Selva, Cosimo Torelli, Danilo Rimondi, Rita Zappa, Stefano Corbani, Giovanni Mastrodomenico, Lara Albani. 84-89 [doi]
- An Integrated Memory Self Test and EDA SolutionR. Dean Adams, Robert Abbott, Xiaoliang Bai, Dwayne Burek, Eric MacDonald. 92-95 [doi]
- A BIST Algorithm for Bit/Group Write Enable Faults in SRAMsSaman Adham, Benoit Nadeau-Dostie. 98-101 [doi]
- Embedded Memory Reliability: The SER ChallengeN. Derhacobian, Valery A. Vardanian, Yervant Zorian. 104-110 [doi]
- Do We Need Anything More Than Single Bit Error Correction (ECC)?Michael Spica, T. M. Mak. 111-116 [doi]
- Redundancy & It s Not Just for Defects AnymoreRobert C. Aitken. 117-120 [doi]