Zaid Al-Ars, Martin Herzog, Ivo Schanstra, A. J. van de Goor. Influence of Bit Line Twisting on the Faulty Behavior of DRAMs. In 12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA. pages 32-37, IEEE Computer Society, 2004. [doi]
Abstract is missing.