Disturb Neighborhood Pattern Sensitive Fault

A. J. van de Goor, Issam B. S. Tlili. Disturb Neighborhood Pattern Sensitive Fault. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 37-47, IEEE Computer Society, 1997. [doi]

Abstract

Abstract is missing.