Relevance as a Metric for Evaluating Machine Learning Algorithms

Aravind Kota Gopalakrishna, Tanir Ozcelebi, Antonio Liotta, Johan J. Lukkien. Relevance as a Metric for Evaluating Machine Learning Algorithms. In Petra Perner, editor, Machine Learning and Data Mining in Pattern Recognition - 9th International Conference, MLDM 2013, New York, NY, USA, July 19-25, 2013. Proceedings. Volume 7988 of Lecture Notes in Computer Science, pages 195-208, Springer, 2013. [doi]

Abstract

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