Jackson Gorham, Lester W. Mackey. Measuring Sample Quality with Stein's Method. In Corinna Cortes, Neil D. Lawrence, Daniel D. Lee, Masashi Sugiyama, Roman Garnett, editors, Advances in Neural Information Processing Systems 28: Annual Conference on Neural Information Processing Systems 2015, December 7-12, 2015, Montreal, Quebec, Canada. pages 226-234, 2015. [doi]
@inproceedings{GorhamM15,
title = {Measuring Sample Quality with Stein's Method},
author = {Jackson Gorham and Lester W. Mackey},
year = {2015},
url = {http://papers.nips.cc/paper/5768-measuring-sample-quality-with-steins-method},
researchr = {https://researchr.org/publication/GorhamM15},
cites = {0},
citedby = {0},
pages = {226-234},
booktitle = {Advances in Neural Information Processing Systems 28: Annual Conference on Neural Information Processing Systems 2015, December 7-12, 2015, Montreal, Quebec, Canada},
editor = {Corinna Cortes and Neil D. Lawrence and Daniel D. Lee and Masashi Sugiyama and Roman Garnett},
}