Jackson Gorham, Lester W. Mackey. Measuring Sample Quality with Stein's Method. In Corinna Cortes, Neil D. Lawrence, Daniel D. Lee, Masashi Sugiyama, Roman Garnett, editors, Advances in Neural Information Processing Systems 28: Annual Conference on Neural Information Processing Systems 2015, December 7-12, 2015, Montreal, Quebec, Canada. pages 226-234, 2015. [doi]
Abstract is missing.