New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure

Michael Goroll, Reinhard Pufall, Stefano Aresu, Wolfgang Gustin. New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure. Microelectronics Reliability, 48(8-9):1509-1512, 2008. [doi]

Abstract

Abstract is missing.