Kentaro Goto, Masato Uchida. Tsallis Entropy Based Labelling. In M. Arif Wani, Feng Luo 0001, Xiaolin Andy Li, Dejing Dou, Francesco Bonchi, editors, 19th IEEE International Conference on Machine Learning and Applications, ICMLA 2020, Miami, FL, USA, December 14-17, 2020. pages 33-40, IEEE, 2020. [doi]
Abstract is missing.