A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters

Shalabh Goyal, Abhijit Chatterjee, Michael Purtell. A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters. J. Electronic Testing, 23(1):95-106, 2007. [doi]

Authors

Shalabh Goyal

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Abhijit Chatterjee

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Michael Purtell

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