Abhilash Goyal, Madhavan Swaminathan. Low-Cost One-Port Approach for Testing Integrated RF Substrates. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 49-54, IEEE Computer Society, 2008. [doi]
@inproceedings{GoyalS08-2,
title = {Low-Cost One-Port Approach for Testing Integrated RF Substrates},
author = {Abhilash Goyal and Madhavan Swaminathan},
year = {2008},
doi = {10.1109/ATS.2008.56},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2008.56},
researchr = {https://researchr.org/publication/GoyalS08-2},
cites = {0},
citedby = {0},
pages = {49-54},
booktitle = {17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3396-4},
}