Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee, Duane C. Howard, John D. Cressler. A self-testable SiGe LNA and Built-in-Self-Test methodology for multiple performance specifications of RF amplifiers. In Keith A. Bowman, Kamesh V. Gadepally, Pallab Chatterjee, Mark M. Budnik, Lalitha Immaneni, editors, Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012. pages 7-12, IEEE, 2012. [doi]
@inproceedings{GoyalSCHC12-0,
title = {A self-testable SiGe LNA and Built-in-Self-Test methodology for multiple performance specifications of RF amplifiers},
author = {Abhilash Goyal and Madhavan Swaminathan and Abhijit Chatterjee and Duane C. Howard and John D. Cressler},
year = {2012},
doi = {10.1109/ISQED.2012.6187467},
url = {http://dx.doi.org/10.1109/ISQED.2012.6187467},
researchr = {https://researchr.org/publication/GoyalSCHC12-0},
cites = {0},
citedby = {0},
pages = {7-12},
booktitle = {Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012},
editor = {Keith A. Bowman and Kamesh V. Gadepally and Pallab Chatterjee and Mark M. Budnik and Lalitha Immaneni},
publisher = {IEEE},
isbn = {978-1-4673-1034-5},
}