A self-testable SiGe LNA and Built-in-Self-Test methodology for multiple performance specifications of RF amplifiers

Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee, Duane C. Howard, John D. Cressler. A self-testable SiGe LNA and Built-in-Self-Test methodology for multiple performance specifications of RF amplifiers. In Keith A. Bowman, Kamesh V. Gadepally, Pallab Chatterjee, Mark M. Budnik, Lalitha Immaneni, editors, Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012. pages 7-12, IEEE, 2012. [doi]

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