Improved First-Order Parameterized Statistical Timing Analysis for Handling Slew and Capacitance Variation - researchr publication authors

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Ratnakar Goyal, Sachin Shrivastava, Harindranath Parameswaran, Parveen Khurana. Improved First-Order Parameterized Statistical Timing Analysis for Handling Slew and Capacitance Variation. In 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India. pages 278-282, IEEE Computer Society, 2007. [doi]

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