David Gray, David Bowes, Neil Davey, Yi Sun, Bruce Christianson. Software defect prediction using static code metrics underestimates defect-proneness. In International Joint Conference on Neural Networks, IJCNN 2010, Barcelona, Spain, 18-23 July, 2010. pages 1-7, IEEE, 2010. [doi]
@inproceedings{GrayBDSC10, title = {Software defect prediction using static code metrics underestimates defect-proneness}, author = {David Gray and David Bowes and Neil Davey and Yi Sun and Bruce Christianson}, year = {2010}, doi = {10.1109/IJCNN.2010.5596650}, url = {http://dx.doi.org/10.1109/IJCNN.2010.5596650}, researchr = {https://researchr.org/publication/GrayBDSC10}, cites = {0}, citedby = {0}, pages = {1-7}, booktitle = {International Joint Conference on Neural Networks, IJCNN 2010, Barcelona, Spain, 18-23 July, 2010}, publisher = {IEEE}, isbn = {978-1-4244-6916-1}, }